89-757 37 mm Dia. Mounted NUV Machine Vision Imaging Filter; t=1.75 mm 325nm
- Type
- Filter
- Subtype
- Bandpass Filter
- Brand
- Edmund Optics
Properties
- Shape
- Circular
- Diameter
- 37 mm
- Cut Off Frequency
- 372.5 nm
- Cut On Frequency
- 277.5 nm
Material
- Name
- UVFS
- Dispersion Equation
- Sellmeier
- n (λ)
- 1.481637775147018
- λ
- 325 nm
- B1
- 0.6961663
- C1
- 0.004679148 μm2
- B2
- 0.4079426
- C2
- 0.013512063 μm2
- B3
- 0.8974794
- C3
- 97.93400254 μm2
89-757 37 mm Dia. Mounted NUV Machine Vision Imaging Filter; t=1.75 mm 325nm
The 89-757 is a 37 mm diameter, 1.75 mm thick bandpass filter, specifically designed for machine vision imaging applications in the near-ultraviolet (NUV) spectrum. This filter, offered by Edmund Optics, is a crucial component for systems that require precise wavelength selection and blocking of unwanted light.
The filter's primary wavelength (CWL) is 325nm, with a cut-on wavelength of 277.5nm and a cut-off wavelength of 372.5nm. This specifications ensure that only light within the desired wavelength range is transmitted, enhancing the image quality and accuracy of the system.
The 89-757 filter is made from UVFS Mal-1965 material, a high-quality optical material known for its excellent transmission properties in the NUV range. The filter is coated with EDM 89-753 on both the front and back surfaces, further enhancing its performance and durability.
The filter's thin lens shape and circular geometry make it compatible with a wide range of optical systems. The 37 mm diameter provides a generous aperture, allowing for high light throughput and excellent image quality.
This filter is currently in stock and available for purchase through the Edmund Optics website. The provided weblink leads directly to the product page, ensuring a seamless shopping experience for users.
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