89-795 32.5 mm Dia. Mounted VIS Machine Vision Imaging Filter; t=1.75 mm 548nm
- Type
- Filter
- Subtype
- Bandpass Filter
- Brand
- Edmund Optics
Properties
- Shape
- Circular
- Diameter
- 32.5 mm
- Cut Off Frequency
- 693 nm
- Cut On Frequency
- 403 nm
Material
- Name
- UVFS
- Dispersion Equation
- Sellmeier
- n (λ)
- 1.4599956660319826
- λ
- 548 nm
- B1
- 0.6961663
- C1
- 0.004679148 μm2
- B2
- 0.4079426
- C2
- 0.013512063 μm2
- B3
- 0.8974794
- C3
- 97.93400254 μm2
89-795 32.5 mm Dia. Mounted VIS Machine Vision Imaging Filter; t=1.75 mm 548nm
The 89-795 is a 32.5 mm diameter, 1.75 mm thick mounted Bandpass Filter, specifically designed for Machine Vision Imaging applications. This filter is sourced from the renowned optical vendor, Edmund Optics, and boasts a catalog number of 89-795.
The filter is designed to transmit light in the center wavelength (CWL) of 548nm, making it ideal for applications that require precise wavelength selection. Its cut-on wavelength is 403nm, and the cut-off wavelength is 693nm, ensuring a narrow bandwidth transmission.
The 89-795 features a UV-IR Cut-off M305x0.50 Machine Vision Filter, which is coated with EDM 89-794 on both the front and back surfaces. This coating enhances the filter's performance and durability, making it suitable for rigorous imaging applications.
The filter's geometry is designed in a Thin Lens shape, providing excellent optical performance. The filter's physical data, including its cut-on, cut-off, and CWL, are carefully calibrated to ensure accurate and consistent performance.
The 89-795 is currently in stock and available for purchase through the Edmund Optics website, as indicated by its weblink status. For more information, users can visit the provided weblink: https://www.edmundoptics.com/p/uv-ir-cut-off-m305-x-050-machine-vision-filter/32233/
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