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49-334 15 mm Dia. S-BAH11/N-SF10 Achromatic Doublet; EFL=25mm VIS-NIR 400-1000nm

49-334 15 mm Dia. S-BAH11/N-SF10 Achromatic Doublet; EFL=25mm VIS-NIR 400-1000nm

Type
Lens
Subtype
Multiplets
Brand
Edmund Optics
Product webpage
Edmund Optics products in the 3DOptix catalog

Properties

Shape
Circular
Diameter
15 mm
EFL
25 mm
R1
17.97 mm
R2
-11.2 mm

Material 1

Name
S-BAH11
Dispersion Equation
Sellmeier
n (λ)
1.6696557498333158
λ
550 nm
B1
1.5713886
C1
0.00910807936 μm2
B2
0.147869313
C2
0.0402401684 μm2
B3
1.28092846
C3
130.399367 μm2

Material 2

Name
N-SF10
Dispersion Equation
Sellmeier
n (λ)
1.7336618876174243
λ
550 nm
B1
1.62153902
C1
0.0122241457 μm2
B2
0.256287842
C2
0.0595736775 μm2
B3
1.64447552
C3
147.468793 μm2

49-334 15 mm Dia. S-BAH11/N-SF10 Achromatic Doublet; EFL=25mm VIS-NIR 400-1000nm

The 49-334 is a high-quality achromatic doublet lens, designed and manufactured by Edmund Optics. This lens, with a diameter of 15 mm and a focal length of 25 mm, is specifically engineered for use in the visible to near-infrared spectrum, spanning from 400 to 1000 nm.

The lens is composed of two elements: S-BAH11 from Ohara and N-SF10 from Schott. These materials are carefully selected for their optical properties, contributing to the lens's overall performance. The lens features a sophisticated geometry, with radii of curvature of 17.97 mm, -11.2 mm, and -85.31 mm, and a central thickness of 6.27 mm. The edge thickness is 6.06 mm, while the thickness at the first air-glass interface is 1.76 mm.

The lens is coated with Edmund Optics' VIS-NIR coating (edm visnir0sp2002000) on both the front and back surfaces. This coating enhances the lens's transmission and reduces reflection, thereby improving its light-gathering capability and overall performance in the specified wavelength range.

The 49-334 is currently in stock and available for immediate purchase through the Edmund Optics website. With its superior optical properties and robust construction, this lens is an excellent choice for a wide range of applications in the fields of imaging, metrology, and spectroscopy.

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