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49-393 50 mm Dia. N-BAK4/N-SF10 Achromatic Doublet; EFL=250mm VIS-NIR 400-1000nm

49-393 50 mm Dia. N-BAK4/N-SF10 Achromatic Doublet; EFL=250mm VIS-NIR 400-1000nm

Type
Lens
Subtype
Multiplets
Brand
Edmund Optics
Product webpage
Edmund Optics products in the 3DOptix catalog

Properties

Shape
Circular
Diameter
50 mm
EFL
250 mm
R1
162.59 mm
R2
-123.82 mm

Material 1

Name
N-BAK4
Dispersion Equation
Sellmeier
n (λ)
1.5709961571059783
λ
550 nm
B1
1.28834642
C1
0.00779980626 μm2
B2
0.132817724
C2
0.0315631177 μm2
B3
0.945395373
C3
105.965875 μm2

Material 2

Name
N-SF10
Dispersion Equation
Sellmeier
n (λ)
1.7336618876174243
λ
550 nm
B1
1.62153902
C1
0.0122241457 μm2
B2
0.256287842
C2
0.0595736775 μm2
B3
1.64447552
C3
147.468793 μm2

49-393 50 mm Dia. N-BAK4/N-SF10 Achromatic Doublet; EFL=250mm VIS-NIR 400-1000nm

The 49-393 is a high-quality achromatic doublet lens, boasting a 50 mm diameter and an effective focal length of 250mm. This lens is designed for use in the visible to near-infrared spectrum, spanning 400-1000nm.

The lens is crafted from two types of Schott glass, N-BAK4 and N-SF10, which are renowned for their excellent optical properties. The use of these materials ensures high image quality, low chromatic aberration, and excellent light transmission.

The lens geometry is meticulously designed, with a central thickness of 9.75mm and edge thickness of 10.54mm. The radii of curvature are R1: 162.59mm, R2: -123.82mm, and R3: -402.58mm, which contribute to the lens's superior optical performance.

The lens is coated with Edmund Optics' VIS-NIR coating (edm visnir0sp2002000) on both the front and back surfaces. This coating enhances the lens's durability and resistance to environmental factors, while also reducing surface reflections and improving light transmission.

The 49-393 is currently in stock and available for purchase on the Edmund Optics website. With its superior optical performance, robust construction, and wide spectral range, this lens is an excellent choice for a variety of applications in the fields of imaging, spectroscopy, and metrology.

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